Results of search for 'se,phr:"Frontiers in electronic testing."'

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		No cover image available A designer's guide to built-in self-test [electronic resource] / Charles E. Stroud. by Stroud, Charles E ebrary, Inc Series: Frontiers in electronic testing Publication details: Boston : Kluwer Academic Publishers, c2002 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10052668 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi. by Nicolici, Nicola Al-Hashimi, Bashir ebrary, Inc Series: Frontiers in electronic testing ; 22. Publication details: Boston : Kluwer Academic Publishers, c2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10066763 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available High performance memory testing [electronic resource] : design principles, fault modeling, and self-test / R. Dean Adams. by Adams, R. Dean ebrary, Inc Series: Frontiers in electronic testing Publication details: Boston : Kluwer Academic, c2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10067254 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Boundary-scan interconnect diagnosis [electronic resource] / José T. de Sousa, Peter Y.K. Cheung. by Sousa, José T. de Cheung, Peter Y. K ebrary, Inc Series: Frontiers in electronic testing ; 18. Publication details: Boston : Kluwer Academic Publishers, c2001 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10067374 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Fault injection techniques and tools for embedded systems reliability evaluation [electronic resource] / edited by Alfredo Benso and Paolo Prinetto. by Benso, Alfredo Prinetto, Paolo ebrary, Inc Series: Frontiers in electronic testing ; 23. Publication details: Boston : Kluwer Academic Publishers, c2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10078628 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Verification by error modeling [electronic resource] : using testing techniques in hardware verification / written by Katarzyna Radecka, Zeljko Zilic. by Radecka, Katarzyna Zilic, Zeljko ebrary, Inc Series: Frontiers in electronic testing ; 25. Publication details: Boston : Kluwer Academic Publishers, 2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10088540 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Verification by error modeling [electronic resource] : using testing techniques in hardware verification / written by Katarzyna Radecka, Zeljko Zilic. by Radecka, Katarzyna Zilic, Zeljko ebrary, Inc Series: Frontiers in electronic testing ; 25. Publication details: Boston : Kluwer Academic Publishers, 2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie. by Nadeau-Dostie, Benoit ebrary, Inc Series: Frontiers in electronic testing Publication details: Boston : Kluwer Academic, c2000 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available A designer's guide to built-in self-test [electronic resource] / Charles E. Stroud. by Stroud, Charles E ebrary, Inc Series: Frontiers in electronic testing Publication details: Boston : Kluwer Academic Publishers, c2002 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits [electronic resource] / Michael L. Bushnell, Vishwani D. Agrawal. by Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D, 1943- ebrary, Inc Series: Frontiers in electronic testing ; 17. Publication details: New York : Kluwer Academic, c2002 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi. by Nicolici, Nicola Al-Hashimi, Bashir ebrary, Inc Series: Frontiers in electronic testing ; 22. Publication details: Boston : Kluwer Academic Publishers, c2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available High performance memory testing [electronic resource] : design principles, fault modeling, and self-test / R. Dean Adams. by Adams, R. Dean ebrary, Inc Series: Frontiers in electronic testing Publication details: Boston : Kluwer Academic, c2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Boundary-scan interconnect diagnosis [electronic resource] / Jos�e T. de Sousa, Peter Y.K. Cheung. by Sousa, Jos�e T. de Cheung, Peter Y. K ebrary, Inc Series: Frontiers in electronic testing ; 18. Publication details: Boston : Kluwer Academic Publishers, c2001 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Fault injection techniques and tools for embedded systems reliability evaluation [electronic resource] / edited by Alfredo Benso and Paolo Prinetto. by Benso, Alfredo Prinetto, Paolo ebrary, Inc Series: Frontiers in electronic testing ; 23. Publication details: Boston : Kluwer Academic Publishers, c2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Verification by error modeling [electronic resource] : using testing techniques in hardware verification / written by Katarzyna Radecka, Zeljko Zilic. by Radecka, Katarzyna Zilic, Zeljko ebrary, Inc Series: Frontiers in electronic testing ; 25. Publication details: Boston : Kluwer Academic Publishers, 2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10088540 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)

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