Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi.

By: Contributor(s): Series: Frontiers in electronic testing ; 22.Publication details: Boston : Kluwer Academic Publishers, c2003.Description: xi, 178 p. : ill. ; 25 cmSubject(s): Genre/Form: DDC classification:
  • 621.39/5/0287 21
LOC classification:
  • TK7874.75 .N53 2003eb
Online resources:
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Holdings: http://site.ebrary.com/lib/strathmore/Doc?id=10066763

Includes bibliographical references (p. 163-173) and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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