High performance memory testing [electronic resource] : design principles, fault modeling, and self-test / R. Dean Adams.
Series: Frontiers in electronic testingPublication details: Boston : Kluwer Academic, c2003.Description: xiii, 246 p. : ill. ; 25 cmSubject(s): Genre/Form: DDC classification:- 621.39/732 21
- TK7895.M4 A27 2003eb
Reviews from LibraryThing.com:
Holdings: http://site.ebrary.com/lib/strathmore/Doc?id=10067254
Includes bibliographical references (p. [229]-239) and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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