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Strathmore

		No cover image available Electric refractory materials [electronic resource] / edited by Yukinobu Kumashiro. by Kumashiro, Yukinobu, 1939- ebrary, Inc Publication details: New York : Marcel Dekker, c2000 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10051258 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Materials research to meet 21st century defense needs [electronic resource] / Committee on Materials Research for Defense After Next, National Materials Advisory Board, Division on Engineering and Physical Sciences, National Research Council of the National Academies. by National Research Council (U.S.). Committee on Materials Research for Defense After Next ebrary, Inc Publication details: Washington, D.C. : National Academies Press, 2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10032355 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Materials research to meet 21st century defense needs [electronic resource] / Committee on Materials Research for Defense After Next, National Materials Advisory Board, Division on Engineering and Physical Sciences, National Research Council of the National Academies. by National Research Council (U.S.). Committee on Materials Research for Defense After Next ebrary, Inc Publication details: Washington, D.C. : National Academies Press, 2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10032355 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Materials research to meet 21st century defense needs [electronic resource] : interim report / Committee on Materials Research for Defense After Next, National Materials Advisory Board, Division on Engineering and Physical Sciences, National Research Council of the National Academies. by National Research Council (U.S.). Committee on Materials Research for Defense After Next ebrary, Inc Publication details: Washington, D.C. : National Academies Press, 2001 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10056964 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Electronic materials science [electronic resource] / Eugene A. Irene. by Irene, Eugene A ebrary, Inc Publication details: Hoboken, N.J. : Wiley-Interscience, c2005 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10114172 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. by International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Or.) ASM International Electronic Device Failure Analysis Society ebrary, Inc Publication details: Materials Park, OH : Asm International, c2008 Other title: Proceedings of the 34th International Symposium for Testing and Failure Analysis 34th International Symposium for Testing and Failure Analysis Thirty-fourth International Symposium for Testing and Failure Analysis Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10320212 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Electronic materials and processes handbook [electronic resource] / Charles A. Harper, editor in chief. by Harper, Charles A ebrary, Inc Series: McGraw-Hill handbooks Edition: 3rd ed. Publication details: New York : McGraw-Hill, 2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10180044 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Electronic materials science [electronic resource] / Eugene A. Irene. by Irene, Eugene A ebrary, Inc Publication details: Hoboken, N.J. : Wiley-Interscience, c2005 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10114172 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Materials research to meet 21st century defense needs [electronic resource] / Committee on Materials Research for Defense After Next, National Materials Advisory Board, Division on Engineering and Physical Sciences, National Research Council of the National Academies. by National Research Council (U.S.). Committee on Materials Research for Defense After Next ebrary, Inc Publication details: Washington, D.C. : National Academies Press, 2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Electric refractory materials [electronic resource] / edited by Yukinobu Kumashiro. by Kumashiro, Yukinobu, 1939- ebrary, Inc Publication details: New York : Marcel Dekker, c2000 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Materials research to meet 21st century defense needs [electronic resource] : interim report / Committee on Materials Research for Defense After Next, National Materials Advisory Board, Division on Engineering and Physical Sciences, National Research Council of the National Academies. by National Research Council (U.S.). Committee on Materials Research for Defense After Next ebrary, Inc Publication details: Washington, D.C. : National Academies Press, 2001 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Electronic materials science [electronic resource] / Eugene A. Irene. by Irene, Eugene A ebrary, Inc Publication details: Hoboken, N.J. : Wiley-Interscience, c2005 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. by International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Or.) ASM International Electronic Device Failure Analysis Society ebrary, Inc Publication details: Materials Park, OH : Asm International, c2008 Other title: Proceedings of the 34th International Symposium for Testing and Failure Analysis 34th International Symposium for Testing and Failure Analysis Thirty-fourth International Symposium for Testing and Failure Analysis Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available ISTFA 2002 [electronic resource] : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. / sponsored by EDFAS, ISTFA. by International Symposium for Testing and Failure Analysis (28th : 2002 : Phoenix, Ariz.) ASM International Electronic Device Failure Analysis Society ebrary, Inc Publication details: Materials Park, OH : ASM International, 2002 Other title: Proceedings of the 28th International Symposium for Testing and Failure Analysis Conference proceedings from the 28th International Symposium for Testing and Failure Analysis Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available ISTFA 2007 [electronic resource] : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International. by International Symposium for Testing and Failure Analysis (33rd : 2007 : San Jose, Calif.) ASM International Electronic Device Failure Analysis Society ebrary, Inc Publication details: Materials Park, OH : ASM International, c2007 Other title: Proceedings of the 33rd International Symposium for Testing and Failure Analysis 33rd International Symposium for Testing and Failure Analysis Thirty-third International Symposium for Testing and Failure Analysis Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available ISTFA 2000 [electronic resource] : proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. by International Symposium for Testing and Failure Analysis (26th : 2000 : Bellevue, Wash.) ASM International Electronic Device Failure Analysis Society ebrary, Inc Publication details: Materials Park, OH : ASM International, c2000 Other title: Proceedings of the 26th International Symposium or Testing and Failure Analysis Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Microelectronic failure analysis [electronic resource] : desk reference : 2001 supplement / prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee. by Electronic Device Failure Analysis Society ebrary, Inc Publication details: Materials Park, OH : ASM International, c2001 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available ISTFA 2001 [electronic resource] : proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS. by International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.) ASM International Electronic Device Failure Analysis Society ebrary, Inc Publication details: Materials Park, OH : ASM International, c2001 Other title: Proceedings of the 27th International Symposium or Testing and Failure Analysis Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available ISTFA '99 [electronic resource] : proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California. by International Symposium for Testing and Failure Analysis (25th : 1999 : Santa Clara, Calif.) ASM International Electronic Device Failure Analysis Society ebrary, Inc Publication details: Materials Park, OH : ASM International, c1999 Other title: Proceedings of the 25th International Symposium or Testing and Failure Analysis Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available ISTFA 2005 [electronic resource] : Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International. by International Symposium for Testing and Failure Analysis (31st : d2005 : San Jose, Calif.) ASM International Electronic Device Failure Analysis Society ebrary, Inc Publication details: Materials Park, OH : ASM International, c2005 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)

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