ISTFA 2005 [electronic resource] : Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International.
Publication details: Materials Park, OH : ASM International, c2005.Description: xviii, 524 p. : illSubject(s): Genre/Form: LOC classification:- TK7871 .I63 2005eb
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Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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