ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International.

By: Contributor(s): Publication details: Materials Park, OH : Asm International, c2008.Description: xx, 528 p. : illOther title:
  • Proceedings of the 34th International Symposium for Testing and Failure Analysis
  • 34th International Symposium for Testing and Failure Analysis
  • Thirty-fourth International Symposium for Testing and Failure Analysis
Subject(s): Genre/Form: LOC classification:
  • TK7871 .I68 2008eb
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Item type Current library Call number URL Status Date due Barcode Item holds
E-Book E-Book Strathmore University (Main Library) Online Resource Link to resource Not for loan
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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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