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		No cover image available Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi. by Nicolici, Nicola Al-Hashimi, Bashir ebrary, Inc Series: Frontiers in electronic testing ; 22. Publication details: Boston : Kluwer Academic Publishers, c2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10066763 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi. by Nicolici, Nicola Al-Hashimi, Bashir ebrary, Inc Series: Frontiers in electronic testing ; 22. Publication details: Boston : Kluwer Academic Publishers, c2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)

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