000 01425nam a2200385 a 4500
001 ebr10017829
003 CaPaEBR
005 20260707174010.0
006 m u
007 cr cn|||||||||
008 010730s2001 enka sb 001 0 eng
010 _z 00037716
015 _aGBA1-43398
016 7 _a0748409688
_2Uk
020 _z0748409688(pbk.) :
_cNo price
040 _aCaPaEBR
_cCaPaEBR
035 _a(OCoLC)646710528
050 1 4 _aQH212.E4
_bG62 2001eb
082 0 4 _a502.825
_221
090 _c64242
_d60879
100 1 _aGoodhew, Peter J.
_995097
245 1 0 _aElectron microscopy and analysis
_h[electronic resource] /
_cPeter J. Goodhew, John Humphreys, Richard Beanland.
250 _a3rd ed.
260 _aLondon :
_bTaylor & Francis,
_c2001.
300 _axi, 251 p. :
_bill. ;
_c24 cm.
500 _aPrevious ed.: 1988.
504 _aIncludes bibliographical references and index.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2005.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aElectron microscopy.
_995098
655 7 _aElectronic books.
_2local
_9190
700 1 _aBeanland, R.
_995099
700 1 _aHumphreys, F. J.
_995100
710 2 _aebrary, Inc.
_9191
856 4 0 _uhttp://site.ebrary.com/lib/strathmore/Doc?id=10017829
_zAn electronic book accessible through the World Wide Web; click to view
999 _c64242
_d60879