| 000 | 01409nam a2200361Ia 4500 | ||
|---|---|---|---|
| 001 | ebr10088550 | ||
| 003 | CaPaEBR | ||
| 005 | 20260707191746.0 | ||
| 006 | m u | ||
| 007 | cr cn||||||||| | ||
| 008 | 040318s2004 nyua sb 001 0 eng d | ||
| 010 | _z 2004047755 | ||
| 020 | _z0306486369 | ||
| 020 | _z030648496X | ||
| 040 |
_aCaPaEBR _cCaPaEBR |
||
| 035 | _a(OCoLC)55499480 | ||
| 050 | 1 | 4 |
_aQA76.5 _b.X54 2004eb |
| 082 | 0 | 4 |
_a004 _222 |
| 100 | 1 |
_aXie, M. _q(Min) _9124503 |
|
| 245 | 1 | 0 |
_aComputing systems reliability _h[electronic resource] : _bmodels and analysis / _cMin Xie, Yuan-Shum Dai, and Kim-Leng Poh. |
| 260 |
_aNew York : _bKluwer Academic/Plenum Publishers, _cc2004. |
||
| 300 |
_axiii, 293 p. : _bill. |
||
| 504 | _aIncludes bibliographical references (p. 275-289) and index. | ||
| 533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2009. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
||
| 650 | 0 |
_aElectronic digital computers _xReliability. _9126288 |
|
| 650 | 0 |
_aComputers _xReliability. _954935 |
|
| 655 | 7 |
_aElectronic books. _2local _9190 |
|
| 700 | 1 |
_aDai, Yuan-Shun. _9126289 |
|
| 700 | 1 |
_aPoh, Kim-Leng. _9126290 |
|
| 710 | 2 |
_aebrary, Inc. _9191 |
|
| 856 | 4 | 0 |
_uhttp://site.ebrary.com/lib/strathmore/Doc?id=10088550 _zAn electronic book accessible through the World Wide Web; click to view |
| 942 | _cEBK | ||
| 999 |
_c217881 _d189133 |
||