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		No cover image available Stochastic models in reliability [electronic resource] / Terje Aven, Uwe Jensen. by Aven, T. (Terje) Jensen, Uwe, 1931- ebrary, Inc Series: Applications of mathematics ; 41. Publication details: New York : Springer, c1999 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Advances in mathematical modeling for reliability [electronic resource] / edited by Tim Bedford ... [et al.]. by Bedford, T ebrary, Inc Mathematical Methods in Reliability (5th : 2007 : Glasgow, Scotland) Publication details: Amsterdam ; Washington, DC : IOS Press, c2008 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10267472 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Advances in mathematical modeling for reliability [electronic resource] / edited by Tim Bedford ... [et al.]. by Bedford, T ebrary, Inc Mathematical Methods in Reliability (5th : 2007 : Glasgow, Scotland) Publication details: Amsterdam ; Washington, DC : IOS Press, c2008 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10267472 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Advances in mathematical modeling for reliability [electronic resource] / edited by Tim Bedford ... [et al.]. by Bedford, T ebrary, Inc Mathematical Methods in Reliability (5th : 2007 : Glasgow, Scotland) Publication details: Amsterdam ; Washington, DC : IOS Press, c2008 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10267472 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Advanced reliability modeling II [electronic resource] : reliability testing and improvement : proceedings of the 2nd Asian International Workshop (AIWARM 2006), Busan, Korea, 24-26 August 2006 / edited by Won Young Yun, Tadashi Dohi. by Asian International Workshop on Advanced Reliability Modeling (2nd : 2006 : Pusan, Korea) Dohi, Tadashi Yun, Won Young ebrary, Inc Publication details: Singapore ; Hong Kong : World Scientific, c2006 Other title: Proceedings of the 2nd Asian International Workshop AIWARM 2006 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10201334 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Advanced reliability modeling [electronic resource] : part II / guest editors: Tadashi Dohi, Naoto Kaio and Won Young Yun. by Dohi, Tadashi Kaio, Naoto Yun, Won Young ebrary, Inc Series: Journal of Quality in Maintenance Engineering ; 12, no. 4 Publication details: Bradford, England : Emerald Group Publishing, c2006 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10156460 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Advanced reliability modeling [electronic resource] : proceedings of the 2004 Asian International Workshop (AIWARM 2004) : Hiroshima, Japan, 26-27 August 2004 / edited by Tadashi Dohi, Won Young Yun. by Asian International Workshop on Advanced Reliability Modeling (2004 : Hiroshima-shi, Japan) Dohi, Tadashi Yun, Won Young ebrary, Inc Publication details: New Jersey ; London : World Scientific, c2004 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10174083 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Advanced reliability modeling [electronic resource] : proceedings of the 2004 Asian International Workshop (AIWARM 2004) : Hiroshima, Japan, 26-27 August 2004 / edited by Tadashi Dohi, Won Young Yun. by Asian International Workshop on Advanced Reliability Modeling (2004 : Hiroshima-shi, Japan) Dohi, Tadashi Yun, Won Young ebrary, Inc Publication details: New Jersey ; London : World Scientific, c2004 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10174083 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Advanced reliability modeling [electronic resource] : part II / guest editors: Tadashi Dohi, Naoto Kaio and Won Young Yun. by Dohi, Tadashi Kaio, Naoto Yun, Won Young ebrary, Inc Series: Journal of Quality in Maintenance Engineering ; 12, no. 4 Publication details: Bradford, England : Emerald Group Publishing, c2006 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10156460 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Advanced reliability modeling [electronic resource] : proceedings of the 2004 Asian International Workshop (AIWARM 2004) : Hiroshima, Japan, 26-27 August 2004 / edited by Tadashi Dohi, Won Young Yun. by Asian International Workshop on Advanced Reliability Modeling (2004 : Hiroshima-shi, Japan) Dohi, Tadashi Yun, Won Young ebrary, Inc Publication details: New Jersey ; London : World Scientific, c2004 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10174083 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Stochastic models in reliability [electronic resource] / Terje Aven, Uwe Jensen. by Aven, T. (Terje) Jensen, Uwe, 1931- ebrary, Inc Series: Applications of mathematics ; 41. Publication details: New York : Springer, c1999 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=5006014 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Advanced reliability modeling [electronic resource] : part II / guest editors: Tadashi Dohi, Naoto Kaio and Won Young Yun. by Dohi, Tadashi Kaio, Naoto Yun, Won Young ebrary, Inc Series: Journal of Quality in Maintenance Engineering ; 12, no. 4 Publication details: Bradford, England : Emerald Group Publishing, c2006 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Advanced reliability modeling [electronic resource] : proceedings of the 2004 Asian International Workshop (AIWARM 2004) : Hiroshima, Japan, 26-27 August 2004 / edited by Tadashi Dohi, Won Young Yun. by Asian International Workshop on Advanced Reliability Modeling (2004 : Hiroshima-shi, Japan) Dohi, Tadashi Yun, Won Young ebrary, Inc Publication details: New Jersey ; London : World Scientific, c2004 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Advanced reliability modeling II [electronic resource] : reliability testing and improvement : proceedings of the 2nd Asian International Workshop (AIWARM 2006), Busan, Korea, 24-26 August 2006 / edited by Won Young Yun, Tadashi Dohi. by Asian International Workshop on Advanced Reliability Modeling (2nd : 2006 : Pusan, Korea) Dohi, Tadashi Yun, Won Young ebrary, Inc Publication details: Singapore ; Hong Kong : World Scientific, c2006 Other title: Proceedings of the 2nd Asian International Workshop AIWARM 2006 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Advances in mathematical modeling for reliability [electronic resource] / edited by Tim Bedford ... [et al.]. by Bedford, T ebrary, Inc Mathematical Methods in Reliability (5th : 2007 : Glasgow, Scotland) Publication details: Amsterdam ; Washington, DC : IOS Press, c2008 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Semi-Markov chains and hidden semi-Markov models toward applications [electronic resource] : their use in reliability and DNA analysis / Vlad Stefan Barbu and Nikolaos Limnios. by Barbu, Vlad Stefan Limnios, N. (Nikolaos) ebrary, Inc Series: Lecture notes in statistics (Springer-Verlag) ; v. 191. Publication details: New York : Springer, 2008 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Stochastic reliability modeling, optimization and applications [electronic resource] / editors, Syouji Nakamura, Toshio Nakagawa. by Nakamura, Syouji Nakagawa, Toshio, 1942- ebrary, Inc Publication details: Singapore ; Hackensack, NJ : World Scientific, c2010 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Probabilistic reliability models [electronic resource] / Igor Ushakov. by Ushakov, I. A. (Igor� Alekseevich) ebrary, Inc Publication details: San Diego, Calif. : Wiley, c2012 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Applied reliability engineering and risk analysis [electronic resource] : probabilistic models and statistical inference / editors, Ilia B. Frenkel ... [et al.]. by Frenkel, Ilia, Ph.D ebrary, Inc Series: Wiley series in quality and reliability engineering Edition: 1st ed. Publication details: Chichester, West Sussex : John Wiley & Sons Inc., 2014 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)

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