Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits [electronic resource] / Michael L. Bushnell, Vishwani D. Agrawal.
Series: Frontiers in electronic testing ; 17.Publication details: New York : Kluwer Academic, c2002.Description: xviii, 690 p. : illSubject(s): Genre/Form: LOC classification:- TK7874.75 .B87 2002eb
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| Item type | Current library | Call number | URL | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
E-Book
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Strathmore University (Main Library) Online Resource | Link to resource | Not for loan |
Total holds: 0
Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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