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Advanced reliability modeling II [electronic resource] : reliability testing and improvement : proceedings of the 2nd Asian International Workshop (AIWARM 2006), Busan, Korea, 24-26 August 2006 / edited by Won Young Yun, Tadashi Dohi.

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Publication details: Singapore ; Hong Kong : World Scientific, c2006.Description: xvii, 795 p. : illOther title:

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Holdings: http://site.ebrary.com/lib/strathmore/Doc?id=10201334

Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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