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Oxide reliability [electronic resource] : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin.

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Series: Selected topics in electronics and systems ; v. 23.Publication details: [River Edge, NJ] : World Scientific, c2002.Description: ix, 270 p. : ill. ; 26 cmSubject(s):

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Holdings: http://site.ebrary.com/lib/strathmore/Doc?id=10201190

Includes bibliographical references.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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