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		No cover image available Fatal defects : chasing killer computer bubs by Peterson, I Publication details: New York Times books 1995 Availability: Items available for loan: Strathmore University (Main Library) (2)Call number: QA76.76.R44P48 1995, ... Place hold Place recall Request article Log in to add tags Add to cart (remove)
		Guide to reliability engineering : data, analysis, applications, implementation, and management / C. (Raj) Sundararajan. by Sundararajan, C Publication details: New York : Van Nostrand Reinhold, c1991 Availability: Items available for loan: Strathmore University (Main Library) (1)Call number: TA169.S96 1991. Found in Open Library: Place hold Place recall Request article Log in to add tags Add to cart (remove)
		The day the phones stopped : the computer crisis-- the what and why of it, and how we can beat it / by Leonard Lee. by Lee, Leonard, 1960- Publication details: New York : Donald I. Fine, c1991 Availability: Items available for loan: Strathmore University (Main Library) (1)Call number: QA76.76.R44L44 1991. Found in Open Library: Place hold Place recall Request article Log in to add tags Add to cart (remove)
		Reliability, maintainability and risk : practical methods for engineers / David J. Smith. by Smith, David John, 1943- Edition: 5th ed. Publication details: Oxford ; Boston : Butterworth Heinemann, 1997 Availability: Items available for loan: Strathmore University (Main Library) (1)Call number: TA169.S64 2001. Found in Open Library: Place hold Place recall Request article Log in to add tags Add to cart (remove)
		Social capital [electronic resource] : A multifaceted perspective by Dasgupta, Partha Serageldin, Ismail, 1944- Series: World Bank e-Library Publication details: Washington, D.C. : World Bank, c2000 Online resources: Click here to access online Availability: http://www.worldbank.icebox.ingenta.com/content/wb/416 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Stochastic models in reliability [electronic resource] / Terje Aven, Uwe Jensen. by Aven, T. (Terje) Jensen, Uwe, 1931- ebrary, Inc Series: Applications of mathematics ; 41. Publication details: New York : Springer, c1999 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Social capital [electronic resource] : a multifaceted perspective / [edited by] Partha Dasgupta, Ismail Serageldin. by Dasgupta, Partha Serageldin, Ismail, 1944- ebrary, Inc Publication details: Washington, D.C. : World Bank, c2000 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=5007386 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available World class reliability [electronic resource] : using Multiple Environment Overstress Tests to make it happen / Keki R. Bhote and Adi K. Bhote. by Bhote, Keki R, 1925- Bhote, Adi K ebrary, Inc Publication details: New York : American Management Association, 2004 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Reliability issues for DoD systems [electronic resource] : report of a workshop / Committee on National Statistics, Francisco Samaniego and Michael Cohen, editors. by Samaniego, Francisco Cohen, Michael L ebrary, Inc Publication details: Washington, D.C. : National Academies Press, c2002 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10038592 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Reliability issues for DoD systems [electronic resource] : report of a workshop / Committee on National Statistics, Francisco Samaniego and Michael Cohen, editors. by Samaniego, Francisco Cohen, Michael L ebrary, Inc Publication details: Washington, D.C. : National Academies Press, c2002 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10038592 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Reliability issues for DoD systems [electronic resource] : report of a workshop / Committee on National Statistics, Francisco Samaniego and Michael Cohen, editors. by Samaniego, Francisco Cohen, Michael L ebrary, Inc Publication details: Washington, D.C. : National Academies Press, c2002 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10038592 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Windows Server 2003 clustering & load balancing [electronic resource] / Robert Shimonski. by Shimonski, Robert ebrary, Inc Publication details: New York : McGraw-Hill/Osborne, c2003 Other title: Windows Server 2003 clustering and load balancing Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10045497 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Software testing techniques [electronic resource] : finding the defects that matter / Scott Loveland ... [et al.]. by Loveland, Scott ebrary, Inc Edition: 1st ed. Publication details: Hingham, Mass. : Charles River Media, c2005 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10074879 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Trust or consequences [electronic resource] : build trust today or lose your market tomorrow / Al Golin. by Golin, Al, 1929- ebrary, Inc Publication details: New York : American Management Association, c2004 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Fault injection techniques and tools for embedded systems reliability evaluation [electronic resource] / edited by Alfredo Benso and Paolo Prinetto. by Benso, Alfredo Prinetto, Paolo ebrary, Inc Series: Frontiers in electronic testing ; 23. Publication details: Boston : Kluwer Academic Publishers, c2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10078628 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Building reliable component-based software systems [electronic resource] / Ivica Crnkovic, Magnus Larsson, editors. by Crnkovic, Ivica Larsson, Magnus (Magnus Peter Henrik), 1969- ebrary, Inc Publication details: Boston : Artech House, c2002 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10081948 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Systems reliability and failure prevention [electronic resource] / Herbert Hecht. by Hecht, Herbert ebrary, Inc Series: Artech House technology management and professional development library Publication details: Boston : Artech House, c2004 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1). Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available The stress-strength model and its generalizations [electronic resource] : theory and applications / Samuel Kotz, Yan Lumelskii, Marianna Pensky. by Kotz, Samuel Lumelʹskiĭ, I͡A︡n Petrovich Pensky, Marianna ebrary, Inc Publication details: Singapore ; Hong Kong : World Scientific, c2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10083772 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Computing systems reliability [electronic resource] : models and analysis / Min Xie, Yuan-Shum Dai, and Kim-Leng Poh. by Xie, M. (Min) Dai, Yuan-Shun Poh, Kim-Leng ebrary, Inc Publication details: New York : Kluwer Academic/Plenum Publishers, c2004 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10088550 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)
		No cover image available Advanced wirebond interconnection technology [electronic resource] / by Shankara K. Prasad. by Prasad, Shankara K ebrary, Inc Publication details: Boston : Kluwer Academic Publishers, 2004 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10088575 (1) Found in Open Library: Place recall Request article Log in to add tags Add to cart (remove)

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Your search returned 155 results.