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Electronic circuit behavior / Daniel L. Metzger. by
Publication details: Englewood Cliffs, N.J. : Prentice-Hall, [1975]
Availability: Items available for loan: Strathmore University (Main Library) (1)Call number: TK7867.M43 1975.
Introduction to electron and electromechanical devices / Dewey A. Yeager, Robert L. Gourley. by
Publication details: Englewood Cliffs, N.J. : Prentice-Hall, c1976
Availability: Items available for loan: Strathmore University (Main Library) (1)Call number: TK7870.Y4 1976.
Electronic techniques : shop practices and construction / Robert S. Villanucci, Alexander W. Avtgis, William F. Megow. by
Edition: 2d ed.
Publication details: Englewood Cliffs, N.J. : Prentice-Hall, c1981
Availability: Items available for loan: Strathmore University (Main Library) (1)Call number: TK7870.V497 1981.
ESD : the scourge of electronics / Sten Hellström. by
Publication details: Berlin ; New York : Springer, c1998
Availability: Items available for loan: Strathmore University (Main Library) (1)Call number: TK7870.H425 1998.
Consumer electronics troubleshooting & repair handbook [electronic resource] / Homer L. Davidson. by
Publication details: New York ; London : McGraw Hill, c1999
Availability: http://site.ebrary.com/lib/strathmore/Doc?id=5002203 (1)
A designer's guide to built-in self-test [electronic resource] / Charles E. Stroud. by Series: Frontiers in electronic testing
Publication details: Boston : Kluwer Academic Publishers, c2002
Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10052668 (1)
Microwave component mechanics [electronic resource] / Harri Eskelinen, Pekka Eskelinen. by Series: Artech House microwave library
Publication details: Boston, MA : Artech House, c2003
Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1).
Telecosmos [electronic resource] : the next great telecom revolution / John Edwards. by
Publication details: Hoboken, N.J. : Wiley-Interscience, c2005
Availability: Items available for reference: Strathmore University (Main Library): Not for loan (1).
Electronic materials science [electronic resource] / Eugene A. Irene. by
Publication details: Hoboken, N.J. : Wiley-Interscience, c2005
Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10114172 (1)
Parts selection and management [electronic resource] / edited by Michael G. Pecht. by
Publication details: Hoboken, N.J. : John Wiley, 2004
Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10114199 (1)
ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. by
Publication details: Materials Park, OH : Asm International, c2008
Other title:
  • Proceedings of the 34th International Symposium for Testing and Failure Analysis
  • 34th International Symposium for Testing and Failure Analysis
  • Thirty-fourth International Symposium for Testing and Failure Analysis
Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10320212 (1)
Electronic components and processes [electronic resource] / Preeti Maheshwari. by
Publication details: New Delhi : New Age International, c2006
Availability: http://site.ebrary.com/lib/strathmore/Doc?id=10359398 (1)
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