<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[Strathmore University Library Search for 'an:120599']]> </title> <!-- prettier-ignore-start --> <link> https://opac.library.strathmore.edu/cgi-bin/koha/opac-search.pl?q=ccl=an%3A120599&#38;sort_by=relevance&#38;format=rss </link> <!-- prettier-ignore-end --> <atom:link rel="self" type="application/rss+xml" href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-search.pl?q=ccl=an%3A120599&#38;sort_by=relevance&#38;format=rss" /> <description> <![CDATA[ Search results for 'an:120599' at Strathmore University Library]]> </description> <opensearch:totalResults>26</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-search.pl?q=ccl=an%3A120599&#38;sort_by=relevance&#38;format=opensearchdescription" /> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dan%253A120599" startPage="" /> <item> <title> GaN-based materials and devices growth, fabrication, characterization and performance / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=93168</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> Singapore ; | River Edge, N.J. : World Scientific, .<br /> x, 284 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=93168">Place hold on <em>GaN-based materials and devices</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=93168</guid> </item> <item> <title> Advanced semiconductor devices proceedings of the 2006 Lester Eastman Conference, Cornell, Ithaca, NY, USA, 26 August 2006 / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=108121</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> Singapore ; | Hackensack, NJ : World Scientific, .<br /> viii, 192 p. : , &quot;Originally the conference was known as the IEEE/Cornell Conference on High Performance Devices.&quot;--Preface. </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=108121">Place hold on <em>Advanced semiconductor devices</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=108121</guid> </item> <item> <title> Quantum dots </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=113051</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> River Edge, N.J. : World Scientific, .<br /> vii, 205 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=113051">Place hold on <em>Quantum dots</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=113051</guid> </item> <item> <title> CMOS RF modeling, characterization and applications </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=112992</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> River Edge, N.J. : World Scientific, .<br /> xi, 409 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=112992">Place hold on <em>CMOS RF modeling, characterization and applications</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=112992</guid> </item> <item> <title> Design of high-speed communication circuits </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=113450</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> New Jersey : World Scientific, .<br /> v, 222 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=113450">Place hold on <em>Design of high-speed communication circuits</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=113450</guid> </item> <item> <title> Frontiers in electronics proceedings of the WOFE-04, Wyndham Aruba Beach Resort, 17-23 December 2004 / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=113429</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> New Jersey : World Scientific, .<br /> xxiii, 749 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=113429">Place hold on <em>Frontiers in electronics</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=113429</guid> </item> <item> <title> SiC materials and devices. Vol. 1 / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=113605</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> New Jersey : World Scientific, .<br /> viii, 335 p. : , Material reprinted from International Journal of High Speed Electronics and Systems, v. 15 no. 4 (2005), with original paging in upper corner. 26 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=113605">Place hold on <em>SiC materials and devices.</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=113605</guid> </item> <item> <title> Transformational science and technology for the current and future force proceedings of the 24th US Army Science Conference / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=113581</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> New Jersey : World Scientific, .<br /> xxiii, 576 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=113581">Place hold on <em>Transformational science and technology for the current and future force</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=113581</guid> </item> <item> <title> High-speed optical transceivers integrated circuits designs and optical devices techniques / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=113556</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> Hackensack, NJ : World Scientific, .<br /> xii, 704 p. : 26 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=113556">Place hold on <em>High-speed optical transceivers</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=113556</guid> </item> <item> <title> Physics and modeling of tera-and nano-devices </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=114707</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> Singapore : World Scientific, .<br /> vii, 184 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=114707">Place hold on <em>Physics and modeling of tera-and nano-devices</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=114707</guid> </item> <item> <title> Terahertz science and technology for military and security applications </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=122124</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> Hackensack, NJ : World Scientific, .<br /> viii, 251 p. ; 26 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=122124">Place hold on <em>Terahertz science and technology for military and security applications</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=122124</guid> </item> <item> <title> Physics and modeling of tera-and nano-devices </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=122095</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> Singapore : World Scientific, .<br /> vii, 184 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=122095">Place hold on <em>Physics and modeling of tera-and nano-devices</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=122095</guid> </item> <item> <title> Advanced semiconductor devices proceedings of the 2006 Lester Eastman Conference, Cornell, Ithaca, NY, USA, 26 August 2006 / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=124641</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> Singapore ; | Hackensack, NJ : World Scientific, .<br /> viii, 192 p. : , &quot;Originally the conference was known as the IEEE/Cornell Conference on High Performance Devices.&quot;--Preface. </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=124641">Place hold on <em>Advanced semiconductor devices</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=124641</guid> </item> <item> <title> Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126268</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> [River Edge, NJ] : World Scientific, .<br /> ix, 270 p. : 26 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=126268">Place hold on <em>Oxide reliability</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126268</guid> </item> <item> <title> Quantum dots </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126325</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> River Edge, N.J. : World Scientific, .<br /> vii, 205 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=126325">Place hold on <em>Quantum dots</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126325</guid> </item> <item> <title> CMOS RF modeling, characterization and applications </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126300</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> River Edge, N.J. : World Scientific, .<br /> xi, 409 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=126300">Place hold on <em>CMOS RF modeling, characterization and applications</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126300</guid> </item> <item> <title> Design of high-speed communication circuits </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126490</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> New Jersey : World Scientific, .<br /> v, 222 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=126490">Place hold on <em>Design of high-speed communication circuits</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126490</guid> </item> <item> <title> Frontiers in electronics proceedings of the WOFE-04, Wyndham Aruba Beach Resort, 17-23 December 2004 / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126477</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> New Jersey : World Scientific, .<br /> xxiii, 749 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=126477">Place hold on <em>Frontiers in electronics</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126477</guid> </item> <item> <title> SiC materials and devices. Vol. 1 / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126547</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> New Jersey : World Scientific, .<br /> viii, 335 p. : , Material reprinted from International Journal of High Speed Electronics and Systems, v. 15 no. 4 (2005), with original paging in upper corner. 26 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=126547">Place hold on <em>SiC materials and devices.</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126547</guid> </item> <item> <title> Transformational science and technology for the current and future force proceedings of the 24th US Army Science Conference / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126537</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> New Jersey : World Scientific, .<br /> xxiii, 576 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=126537">Place hold on <em>Transformational science and technology for the current and future force</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126537</guid> </item> <item> <title> High-speed optical transceivers integrated circuits designs and optical devices techniques / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126525</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> Hackensack, NJ : World Scientific, .<br /> xii, 704 p. : 26 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=126525">Place hold on <em>High-speed optical transceivers</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=126525</guid> </item> <item> <title> Breakdown phenomena in semiconductors and semiconductor devices </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=136657</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Levinshteĭn, M. E..<br /> New Jersey ; | London : World Scientific, .<br /> xiii, 208 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=136657">Place hold on <em>Breakdown phenomena in semiconductors and semiconductor devices</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=136657</guid> </item> <item> <title> Breakdown phenomena in semiconductors and semiconductor devices </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=136914</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Levinshteĭn, M. E..<br /> New Jersey ; | London : World Scientific, .<br /> xiii, 208 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=136914">Place hold on <em>Breakdown phenomena in semiconductors and semiconductor devices</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=136914</guid> </item> <item> <title> Radiation defect engineering </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=142493</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Kozlovskiĭ, V. V..<br /> New Jersey ; | London : World Scientific, .<br /> viii, 253 p. : , Reprinted from: International journal of high speed electronics and systems, v. 15, no. 1, 2005. </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=142493">Place hold on <em>Radiation defect engineering</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=142493</guid> </item> <item> <title> Breakdown phenomena in semiconductors and semiconductor devices </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=142470</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Levinshteĭn, M. E..<br /> New Jersey ; | London : World Scientific, .<br /> xiii, 208 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=142470">Place hold on <em>Breakdown phenomena in semiconductors and semiconductor devices</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=142470</guid> </item> <item> <title> High performance devices proceedings of the 2004 IEEE Lester Eastman Conference on High Performance Devices, Rensselaer Polytechnic Institute, 4-6 August 2004 / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=142385</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> New Jersey ; | London : World Scientific, .<br /> xvii, 295 p. : </p> ]]> <![CDATA[ <p> <a href="https://opac.library.strathmore.edu/cgi-bin/koha/opac-reserve.pl?biblionumber=142385">Place hold on <em>High performance devices</em></a> </p> ]]> </description> <guid>https://opac.library.strathmore.edu/cgi-bin/koha/opac-detail.pl?biblionumber=142385</guid> </item> </channel> </rss>
