01425nam a2200385 a 4500001001200000003000800012005001700020006001900037007001500056008004100071010001700112015001500129016001900144020003300163040002100196035002100217050002500238082001600263090001700279100002900296245011500325250001200440260003900452300003300491500002400524504005100548533015200599650003200751655003400783700002400817700002800841710002200869856013100891999001701022ebr10017829CaPaEBR20260707174010.0m        u        cr cn|||||||||010730s2001    enka    sb    001 0 eng    z   00037716   aGBA1-433987 a07484096882Uk  z0748409688(pbk.) :cNo price  aCaPaEBRcCaPaEBR  a(OCoLC)64671052814aQH212.E4bG62 2001eb04a502.825221  c64242d608791 aGoodhew, Peter J.99509710aElectron microscopy and analysish[electronic resource] /cPeter J. Goodhew, John Humphreys, Richard Beanland.  a3rd ed.  aLondon :bTaylor & Francis,c2001.  axi, 251 p. :bill. ;c24 cm.  aPrevious ed.: 1988.  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2005.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aElectron microscopy.995098 7aElectronic books.2local91901 aBeanland, R.9950991 aHumphreys, F. J.9951002 aebrary, Inc.919140uhttp://site.ebrary.com/lib/strathmore/Doc?id=10017829zAn electronic book accessible through the World Wide Web; click to view  c64242d60879