01395nam a2200385 a 4500001001200000003000800012005001700020006001900037007001500056008004100071010001700112015001500129016001900144020002100163040002100184035002000205050002500225082001600250100002900266245011500295250001200410260003900422300002300461500002400484504005100508533015200559650003200711655003400743700002400777700002800801710002200829856013100851942000800982999001900990ebr10017829CaPaEBR20260707190127.0m        u        cr cn|||||||||010730s2001    enka    sb    001 0 eng    z   00037716   aGBA1-433987 a07484096882Uk  z0748409688(pbk.)  aCaPaEBRcCaPaEBR  a(OCoLC)7072458214aQH212.E4bG62 2001eb04a502.8252211 aGoodhew, Peter J.99509710aElectron microscopy and analysish[electronic resource] /cPeter J. Goodhew, John Humphreys, Richard Beanland.  a3rd ed.  aLondon :bTaylor & Francis,c2001.  axi, 251 p. :bill.  aPrevious ed.: 1988.  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2013.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aElectron microscopy.995098 7aElectronic books.2local91901 aBeanland, R.9950991 aHumphreys, F. J.9951002 aebrary, Inc.919140uhttp://site.ebrary.com/lib/strathmore/Doc?id=10017829zAn electronic book accessible through the World Wide Web; click to view  cEBK  c202630d173882