TY  - BOOK
AU  - Dumin,D.J.
ED  - ebrary, Inc.
TI  - Oxide reliability: a summary of silicon oxide wearout, breakdown, and reliability 
T2  - Selected topics in electronics and systems
AV  - TK7871.99.M44 O95 2002eb
U1  - 621.39/732 21
PY  - 2002///
CY  - [River Edge, NJ]
PB  - World Scientific
KW  - Metal oxide semiconductors
KW  - Reliability
KW  - Silicon oxide
KW  - Deterioration
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/strathmore/Doc?id=10201190
ER  -