01377nam a2200337Ia 4500001001200000003000800012005001700020006001900037007001500056008004100071020001800112020001500130040002100145035002100166050002600187090001800213245012800231260004800359300003700407504006400444533015200508650004200660650003300702650003300735650002800768655003400796700003800830710002200868856013100890999001801021ebr10255560CaPaEBR20260707180814.0m        u        cr cn|||||||||071223s2008    njua    sb    001 0 eng d  z9789812778819  z9812778810  aCaPaEBRcCaPaEBR  a(OCoLC)64676838214aTK7895.M4bT47 2008eb  c115089d9024400aTerrestrial neutron-induced soft errors in advanced memory devicesh[electronic resource] /cTakashi Nakamura ... [et al.].  aHackensack, NJ :bWorld Scientific,cc2008.  axxii, 343 p. :bill. (some col.)  aIncludes bibliographical references (p. 291-315) and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2009.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aSemiconductor storage devices.999821 0aNeutron irradiation.9160919 0aRadiation dosimetry.9101611 0aNuclear physics.928794 7aElectronic books.2local91901 aNakamura, Takashi,d1939-91609202 aebrary, Inc.919140uhttp://site.ebrary.com/lib/strathmore/Doc?id=10255560zAn electronic book accessible through the World Wide Web; click to view  c115089d90244