ISTFA 2011 [electronic resource] : conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.
Publication details: Materials Park, Ohio : ASM International, 2011.Description: xix, 456 p. : col. illSubject(s): Genre/Form: LOC classification:- TK7871 .I58 2011eb
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Strathmore University (Main Library) Online Resource | Link to resource | Not for loan |
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Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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