ISTFA 2009 [electronic resource] : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.
Publication details: Materials Park, Ohio : Asm International, 2009.Description: xvi, 355 p. : illSubject(s): Genre/Form: LOC classification:- TK7871 .I58 2009eb
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Item type | Current library | Call number | URL | Status | Date due | Barcode | Item holds | |
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E-Book | Strathmore University (Main Library) Online Resource | Link to resource | Not for loan |
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Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2010. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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