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Electron microscopy and analysis [electronic resource] / Peter J. Goodhew, John Humphreys, Richard Beanland.

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Publication details: London : Taylor & Francis, 2001.Edition: 3rd edDescription: xi, 251 p. : ill. ; 24 cmSubject(s):

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Holdings: http://site.ebrary.com/lib/strathmore/Doc?id=10017829

Previous ed.: 1988.

Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2005. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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